Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...
Electron impact ionisation processes are fundamental interactions in which an energetic electron collides with an atom or ion, resulting in the ejection of one or more electrons. These mechanisms are ...
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