This new whitepaper explores how advanced cross-sectional analysis of battery electrodes - using scanning electron microscopy (SEM) and broad ion beam (BIB) milling - is enabling researchers and ...

Researchers have demonstrated a technique that allows them to track microscopic changes in metals or other materials in real time even when the materials are exposed to extreme heat and loads for an ...

As the development of contemporary materials has continued to advance from the macro scale to nanoscale, the requirement for sophisticated microscopy techniques has increased dramatically. Scanning ...

When studying biological systems, understanding structure and chemistry often calls for different approaches. Scanning electron microscopy (SEM) is particularly useful for revealing ultrastructural ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...