As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

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Traditional semiconductor testing typically involves tests executed by automatic test equipment (ATE). But engineers are beginning to favor an additional late-test pass that tests systems-on-chip ...

Expertise from Forbes Councils members, operated under license. Opinions expressed are those of the author. So, what does this mean for the organizations that develop these products? It means that ...