Abstract: A structural test technique known as "built-in self-test," or BIST, involves adding logic to an IC so that it can periodically test its own functionality. Memory BIST and logic BIST are the ...

Abstract: Deep Neural Networks (DNN) have realized significant achievements across various application domains. There is no doubt that testing and enhancing a pre-trained DNN that has been deployed in ...

This is a cypress reporter that produces JUnit style XML test results and allows to split the same test in different test cases by jira id, this improves performance and avoids reloading the page in ...

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices ...