Abstract: Automotive electronics typically operate in high-temperature environments with significant electrostatic interference, which increases the reliability requirements for on-chip electrostatic ...
Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor
Abstract: Single Event Effect of GaN HEMT devices is usually done using the same testing conditions as the one developed and validated a long time ago for MOSFETs components. This paper presents two ...
The Department of Defense (DOD) identified test and evaluation modernization as a crucial part of its effort to get capabilities to warfighters faster. DOD organizations, including the Office of the ...
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